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TITLE: SYSTEM-ON-CHIP TEST BENCHMARKS
At the IEEE International Test Conference 2002 in October 2002
in Baltimore, MD, a new set of benchmark circuits, with a special
focus on modular plug-and-play testing of core-based system chips,
will be presented.
The purpose of these benchmark circuits is to stimulate research
in new methods and tools for modular testing of core-based SOCs
and to enable the objective comparison of usch methods and tools
with respect to effectiveness and efficiency.
To learn more about the benchmarks, to download the first four or
to subscribe to an email reflector, access: SOC.
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FILENUMBER: 1042
BEGIN_KEYWORDS
SYSTEM-ON-CHIP TEST BENCHMARKS
END_KEYWORDS
DATE: February 2002
TITLE: SYSTEM-ON-CHIP TEST BENCHMARKS
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