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TITLE: Development of Boundary-Scan Library Cells
Boundary-scan library cells targeting the 0.5-micron CMOS process
offered by AMI and available to educational users of MOSIS have
been developed by the University of New Hampshire. The cells
implement functions needed to support IEEE standards 1149.1 and
1149.4 and include a TAP controller, output mux, instruction
register, bypass register, an analog switch, ABM and TBIC. The
cells facilitate teaching design-for-testability and testing in a
VLSI curriculum.
For additional information, access:
UNH
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FILENUMBER: 1113
BEGIN_KEYWORDS
BOUNDARY-SCAN LIBRARY CELLS
END_KEYWORDS
DATE: March 2003
TITLE: Development of Boundary-Scan Library Cells
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