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TITLE: Emerging Trends Discussed at DATE-2006
Design Automation & Test in Europe (DATE) is an annual conference
that discusses emerging trends. This year some the main topics
were: Design for manufacturing (DFM), Networks on Chip (NoCs),
wireless sensor networks, embedded systems, reconfigurable
computing, and automotive electronics, timing and noise analysis,
on-chip power and leakage reduction, design verification, defect
modeling, and nanotechnology. The keynote address was delivered
Dr. Wally Rhines, CEO of Mentor Graphics, who described the
financial and technical impact of electronic design automation,
how tools are purchased and incorporated into the design flow,
and how the number of ASIC and FPGA design starts. Buzzwords of
the conference included not only power, performance and
programmability but also platforms, parallelism, processors,
partitioning and prototyping.
For additional information, access: EDAcafe and DATE
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FILENUMBER: 1253
BEGIN_KEYWORDS
DATE-2006 Report
END_KEYWORDS
DATE: March 2006
TITLE: Emerging Trends Discussed at DATE-2006
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