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TITLE: Experimenting with Integrated Circuit Defects (DefSim)
DefSim is a measurement environment for experimental study of
CMOS defects. An integrated circuit (IC) was intentionally
designed with a large variety of shorts and opens physically
inserted into a set of simple digital circuits. The DefSim chip
was fabricated using the AMS 0.8-micron CMOS (double-metal,
double-poly) process and contains 48,000 transistors. The chip
is attached to a dedicated measurement box serving as an
interface to a computer so that both voltage and IDDQ testing can
be performed.
With DefSim you can:
-Observe the truth table of a correct circuit
-Observe the truth table of a defective circuit
-Obtain defect/fault tables for all specific defects
-Define test patterns automatically or manually
-Activate IDDQ and voltage measurements
-Study behavior of bridging and open faults
-Study and compare different fault models
Two versions have been developed:
(1) DefSim Personal which can be connected directly to a PC, and
(2) DefSim Server which can be accessed via the internet.
Current list prices are:
DefSim Personal (1 box, 1 chip, software): $ 840
DefSim Server minimum config (5 seats, 1 box, 1 chip): $1798
DefSim Server standard (20 seats, 1 box, 2 chips): $2398
DefSim Server maximum (unlimited seats, 2 boxes, 3 chips): $3598
Accessories and upgrade:
Additional DefSim box+chip: $598
Additional seat for DefSim Server: $59
Upgrade to DefSim Server from DefSim Personal: price difference + $60
Support and maintenance:
First year: included
Each next year (voluntary): 15% of the total list price
Shipping cost: added to the price.
For a limited time, potential users can try out a DefSim server
on-line at no charge by accessing:
DefSim
Extensive documentation is also available for free by accessing:
Tech. Report (10 MByte pdf)
User Guide (0.3 MByte pdf)
The DefSim project was funded by the European Union and
coordinated by Prof. Wieslaw Kuzmicz of the Warsaw University of
Technology.
For additional information, send email to: info@defsim.com
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FILENUMBER: 1259
BEGIN_KEYWORDS
Experimenting Defects DefSim
END_KEYWORDS
DATE: April 2006
TITLE: Experimenting with Integrated Circuit Defects (DefSim)
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