MICROELECTRONIC SYSTEMS NEWS

FILENUMBER: 1265 BEGIN_KEYWORDS Radiation-Tolerant Design LEON END_KEYWORDS DATE: June 2006 TITLE: Radiation-Tolerant Design Using LEON
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TITLE: Radiation-Tolerant Design Using LEON

The fault  tolerant  LEON3  processor  in  combination  with  the
radiation  tolerant  ACTEL RTAX2000S FPGA presents an alternative
to the processors currently  used  by  the  space  industry.  The
processor  is  offered  in  standard  configurations suitable for
spacecraft  and  payload  control  applications.   The   standard
configurations   includes   the   LEON3FT   processor  core  with
associated IEEE-754 floating-point unit, two SpaceWire links, two
MIL-STD-1553  BRM, two CAN-2.0 interfaces, memory controller with
ECC, timer unit, two UARTs and 16-bit GPIO port.  To  fit  within
the  resources  of  a single RTAX2000S, five application-specific
sub-set configurations have been  defined.  These  configurations
are  available  as  pre-programmed AX2000/RTAX2000S parts in both
commercial and high-rel quality levels.

To  confirm  the  SEU  (single  event  upset)  tolerance  of  the
LEON3FT-RTAX  processor,  the RTAX2000S part was submitted to Cf-
252 heavy-ion error injection. The error injection lasted for 168
hours,  with a heavy-ion flux of 22 particles/s/cm2 at the device
surface. A total of 2,429 SEU errors were registered in  the  on-
chip  block  RAMs.  All errors were detected and corrected by the
LEON3FT fault-tolerance  logic.  No  anomalies  or  computational
errors were observed. The effective SEU rate was measured to 0.25
errors/minute.

Simulated error injection using the LEON3FT debug  interface  was
performed  and  correlated  with the Cf-252 SEU test data. It was
then possible to determine the Cf-252 SEU  cross-section  for  an
RTAX2000S  block RAM bit to 2.3E-9 cm2/bit. This value correlates
well with earlier cross-section measurement performed by Actel at
the BNL and TAMU cyclotron facilities, confirming the validity of
the Cf-252 test methodology and obtained results.

For additional information, access: Gaisler

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