MICROELECTRONIC SYSTEMS NEWS
FILENUMBER: 1272
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Microelectronics Microsystems Reliability Training
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DATE: June 2006
TITLE: Microelectronics, Microsystems & Reliability Training
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TITLE: Microelectronics, Microsystems & Reliability Training
Courses and seminars and are available on the following topics:
-- Understanding Semiconductor Devices With Optoelectronics
-- Understanding Silicon Technologies (Processing/Process
Integration) for CMOS and MEMS
-- Meeting the Submicron CMOS Challenge
-- Integrated Circuit (and other product) Reliability Course
-- What Integrated Circuit Users Really Need to Know
These have been produced by Dr. Ted Dellin, Chief Scientist
Emeritus of the Microsystems Center at Sandia National
Laboratories in Albuquerque, New Mexico. He received his Ph.D.
in Physics from the City University of New York in 1969. Prior
to becoming Chief Scientist of the Microsystems Center at Sandia,
he was Deputy Director of Reliability, head of the Electronics
Quality/Reliability Center, Manager of the Reliability Physics
and Nonvolatile Technology Departments and a Distinguished Member
of the Technical Staff. Dr. Dellin continues to work part time
for Sandia as a trainer and consultant. He has taught in
nationally televised graduate courses and conferences including 4
tutorials at the IEEE International Reliability Physics
Symposium, 4 tutorials at the Commercialization of Military and
Space Electronics Conference and 1 tutorial at the Defense
Manufacturing Conference. At Sandia, he has implemented a
comprehensive 12-course Microsystems curriculum. He has also
taught short courses for organizations such as Analog Devices,
JPL and Medtronics.
For additional information, access: Training
Email: dellin@ieee.org
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dbouldin@utk.edu
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