MICROELECTRONIC SYSTEMS NEWS
FILENUMBER: 9817
BEGIN_KEYWORDS
SPECIAL_ISSUE PHYSICAL_DESIGN
END_KEYWORDS
DATE: July 1998
TITLE: PHYSICAL DESIGN SPECIAL ISSUE
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VLSI DESIGN: An International Journal of
Custom-Chip Design, Simulation, and Testing
JOURNAL
published by Gordon and Beach Science Publishers
Call For Papers
Special Issue on Physical Design in Deep Submicron
Objective
----------
As physical feature sizes decreases, the time delay of electrical signals
traveling in the interconnect between active devices and gates is approaching
the delay through the devices and gates. The parasitic information of the
interconnect is absolutely critical to predicting circuit performance.
Thus, physical interconnections delay will overtake gate delays as a design
concern by the tear 2000, mandating a shift in the physical design flow for
deep-submicron. Therefore, Iterations between synthesis and layout increase
dramatically due to timing and routability problems.
The key to solving this problem is knowing more about the physical design,
i.e., placement and estimated interconnect, early in the design cycle.
The RTL is being defined to accurately predict size, timing and power,
early in the design cycle and avoid downstream iterations. This means the
design engineer needs to get back to the fundamentals of physics.
It is the goal of this special issue to explore physical level solutions to
the deep submicron problems.
Areas of Interests
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Innovative technical papers are solicited, but not limited to.
1. Layout problems in System on Silicon
2. Timing-driven hierarchical place-and-route
3 Advanced routing for deep submicron technologies
4. Parasitic extraction and delay calculation
5. Lower power physical optimization
6. Clock/Power issues in deep submicron
7. Logic/RTL synthesis predicting physical constraints
8. Physical design database management
9. Reliability Issues due to huge design density
We also invite one or two papers to be tutorial
reviews.
Instructions to Authors
-----------------------
Authors are invited to submit a compressed and uuencoded
postscript file by E-mail (or three hard copies by surface mail) of
an original, unpublished paper by Monday, September 7, 1998 to:
Jun-Dong Cho, Guest Editor
School of Elec. and Comp. Eng.
Sungkyunkwan University
300 Chunchun-Dong Jangan-Ku
Suwon, Korea 440-746
(tel): 0331-290-7127
(fax): 0331-290-7170
jdcho@yurim.skku.ac.kr
Notification of acceptance will be mailed by Nov. 20, 1998.
Accepted papers will be printed as the Journal for the year 2000 volume.
We encourage submissions from work in progress.
Editor In Chief
---------------
Dr. George W. Zobrist
Department of Missouri-Rolla
Rolla, Missouri 65401
FAX: (314) 341-4501
E-mail: zobrist@umr.edu
Regional Editors
----------------
Dr. Bayoumi, USA Editor (digital signal processing)
University of Southwestern Louisiana, Lafayette, Louisiana
Dr. Hideaki Kobayashi, USA Editor (VLSI design methodologies)
University of South Carolina, Columbia, South Carolina
Dr. C. P. RaviKumar, Indian Editor (VLSI physical design)
Indian Institute of Technology, New Delhi, India
Dr. Raul Camposano, European Editor (High level synthesis)
GMD/EIS and University of Paderhorn, Sankt Augustin, Germany
Dr. Sunil R. Das, Canadian Editor (VLSI testing)
University of Ottawa, Ottawa, Canada
Dr. Lalit Patnaik, Southeast Asia Editor (Layout algorithms)
Indian Institute of Science, Bangalore, India
Dr. Hiroto Yasuura, Japanese Editor (High level synthesis)
Kyushu University, Kasuga, Fukuoka, Japan
Editorial Advisory Board
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Dr. Ramon Acosta,
International Software Systems, Inc., Austin, Texas
Dr. Don Bouldin,
Unversity of Tennessee, Knoxville
Dr. Melvin A. Breuer,
University of Southern California, Los Angeles
Dr. Ralph K. Cavin, III,
North Carolina State University, Raleigh
Dr. Narsingh Deo,
University of Central Florida, Orlando
Dr. Srinivas Devadas,
MIT, Cambridge, MA
Dr. Fausto Distante,
Politechnico di Milano, Italy
Dr. Hideo Fujiwara,
Advanced Institute of Science and Technology, Japan
Dr. Huey-Liang Hwang,
National Tsing-Hua University, Hsin-Tsu, Taiwan
Dr. Marwan jabi,
University of Sydney, Australia
Dr. Osamu Karatsu,
NTT-LSI Laboratories, Atsugi-shi, Japan
Dr. Amar Mukherjee,
University of Central Florida, Orlando
Dr. Sabuo Muroga,
University of Illinois, Urbana
Dr. Stephan Olariu,
Old Dominion University, Norfolk, Virginia
Dr. C. V. Ramamoorthy,
University of California, Berkeley
Dr. Andrew Sage,
George Mason University, Fairfax, Virginia
Dr. L. Spaanenburg,
University of Groningen, Netherlands
Dr. Victoria Stavridou,
University of London, Suurey, UK
Dr. Leon Stok,
IBM T. J. Watson Research Center, Yorktown Heights, NY
Dr. Earl Swartzlander,
University of Texas, Austin
Dr. Philip A. Wilsey,
University of Cincinnati, Ohio
Dr. Mehmet Yanilmaz (Book Review Editor),
Comtek Consultants Group, Inc.,Evanston, Illinois
Dr. Si-Qing Zheng,
Louisiana State University, Baton Rouge
For further information concerning the special issue, please contact:
Jun Dong Cho, Guest-Editor.
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dbouldin@utk.edu