MICROELECTRONIC SYSTEMS NEWS
FILENUMBER: 9904 BEGIN_KEYWORDS TEXT DESIGN-FOR-TEST CROUCH END_KEYWORDS DATE: February 2000 TITLE: TEXT ON DESIGN-FOR-TEST OF ICS BY CROUCH================================================================= TITLE: TEXT ON DESIGN-FOR-TEST OF ICS BY CROUCH Design-For-Test For Digital IC's and Embedded Core Systems by Alfred Crouch of Austin, Texas Prentice-Hall Reference Book Published June 1999 Copyright 2000, 356 pp. Cloth ISBN 0-13-084827-1 $75.00 WWW =================================================================
Return to MSN Home Page
dbouldin@utk.edu